Ver.3

Quality and Reliability HAND BOOK

Chapter1:
Reliability of Semiconductor Device
  1. 1-1:
    Basic Policy Toward Quality and Reliability
  2. 1-2:
    Quality and Reliability Assurance System of Sanyo LSI
  3. 1-3:
    Quality and Reliability Construction of Sanyo LSI
Chapter2:
Quality and Reliability Assurance System
  1. 2-1:
    Quality Control in the Manufacturing Processes
  2. 2-2:
    Standard Control and Equipment and Measuring Apparatus Control
  3. 2-3:
    Product Traceability
  4. 2-4:
    Customer Complaint Management
  5. 2-5:
    Training and Learning of Empowerment & Small Group Activities
  6. 2-6:
    Quality Assurance System Standards
Chapter3:
Reliability Test
  1. 3-1:
    Objective of Reliability Test
  2. 3-2:
    Reliability Testing Methods
  3. 3-3:
    Reliability Test Standards
  4. 3-4:
    Reliability Prediction Methods
  5. 3-5:
    Concept of Screening
  6. 2-6:
    Quality Assurance System Standards
Chapter4:
Failure Mechanisms of Semiconductor Devices
  1. 4-1:
    Overview of Failure Mechanisms of Semiconductor Devices
  2. 4-2:
    Electromigration
  3. 4-3:
    Stressmigration
  4. 4-4:
    Stability
  5. 4-5:
    Hot Carrier Injection
  6. 4-6:
    Time Dependent Dielectric Breakdown (TDDB)
  7. 4-7:
    Electrostatic Breakdown
  8. 4-8:
    Latch-up
  9. 4-9:
    Soft Error
  10. 4-10:
    Moisture Resistance
  11. 4-11:
    Data Retention Characteristic of Non-Volatile Memory
  12. 4-12:
    Thermal Stress of SMD in Solder Mounting
  13. 4-13:
    Reliability Degradation Caused by Environmental Thermal Stress
  14. 4-14:
    Wire Bonding Degradation
  15. 4-15:
    Reliability of MCP Structure
  16. 4-16:
    EMC
Chapter5:
Failure Analyses of Semiconductor Devices
  1. 5-1:
    Objectives of Failure Analyses
  2. 5-2:
    Apparatus and Procedure of Analyses
  3. 5-3:
    Analysis Methods
  4. 5-4:
    Analyses Examples
Chapter6:
Precautions and Checkpoints for Usage
  1. 6-1:
    Packing, Storage and Transportation Methods
  2. 6-2:
    Precautions and Checkpoints for Mounting
  3. 6-3:
    Precautions for Preventing Static Electricity
  4. 6-4:
    Other Precautions and Checkpoints
Chapter7:
Environmental Conservation
  1. 7-1:
    Overview
  2. 7-2:
    Environmental Issues and Trends
  3. 7-3:
    The ISO 14000 Series
  4. 7-4:
    Sanyo' s Environmental Conservation Initiatives
  5. 7-5:
    The Semiconductor Company' s Environmental Conservation Initiatives
Chapter8:
Appendices
  1. 8-1:
    Mathematics of Reliability
  2. 8-2:
    Reliability Terminology

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